Posts Tagged ‘Forensic Metrology’

A Long Range Coincidence… or is it?

By: Louis-Étienne Bouchard-Pouliot

In: 3D Hardware| 3D Technologies| Metrology and Inspection

21 Oct 2009

For this time, I’d like to go with a personal experience. I’m just back from Dassault Systemes Consumer Conference in Orlando, FL (DSCC 2009) followed by the VAR Symposium and coincidentally, most of the time, discussions were leading to 3D Long Range Scanning. Just take a look at three subjects that were discussed and one [...]


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